high resolution electron microscopy中文是什么意思

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中文翻譯
造句

高分辨電鏡

high adj. 1.高的〔指物，形容人的身高用 tall〕；高 ...
resolution n. 1.決心，果斷；堅(jiān)定，剛毅。 2.(議會(huì)等的)決定 ...
electron n. 【物理學(xué)】電子。 the electron bea ...
microscopy n. 顯微鏡學(xué)；顯微鏡使用術(shù)。
high-resolution electron microscopy 高分辨電子顯微術(shù)
high resolution light microscopy 高分辨率光學(xué)顯微鏡檢查
high resolution microscopy 高分辨率顯微術(shù)
high voltage electron microscopy 高電壓電子顯微術(shù); 高壓電子顯微鏡檢術(shù); 高壓電子顯微術(shù)
high-voltage electron microscopy 高壓電子顯微術(shù)
high resolution electron microscope 高分辨電子顯微鏡; 高分辨率電子顯微鏡
high-resolution electron microscope 高分辨電鏡; 高分辨電子顯微鏡
electron microscopy 暗場(chǎng)電子顯微術(shù); 電（子顯微）鏡術(shù); 電鏡檢術(shù); 電鏡學(xué); 電子顯微技術(shù); 電子顯微檢測(cè)法; 電子顯微檢查法; 電子顯微鏡檢查法; 電子顯微鏡學(xué)
affinity electron microscopy 親和電鏡（術(shù)）[用親和配體包被銅網(wǎng)
analytic electron microscopy 分析電鏡技術(shù); 分析電子顯微術(shù)
brightfield electron microscopy 明場(chǎng)電子顯微術(shù)
dark-field electron microscopy 暗場(chǎng)電子顯微術(shù)
direct electron microscopy 直接電鏡檢查
electron emission microscopy 電子發(fā)射顯微鏡檢查法
electron microscopy abstracts 電子顯微鏡文摘
electron microscopy analysis 電子顯微鏡分析
electron microscopy and microanalysis 電子顯微鏡檢查和微量分析; 電子顯微鏡檢查及微量分析
electron microscopy autoradiography 電鏡放射自顯影
electron microscopy impression 電子顯微復(fù)型
electron microscopy room 電鏡室
electron microscopy test 電子顯微檢驗(yàn)

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例句與用法

No87 ： two - stage image processing in high resolution electron microscopy , f . h . li , proc . intern . congress on electron microscopy , paris ( 1994 ) vol . 1 , 481 - 4
高分辨電子顯微術(shù)與電子衍射相結(jié)合測(cè)定晶體結(jié)構(gòu)，李方華，自然科學(xué)進(jìn)展- - -國(guó)家重點(diǎn)實(shí)驗(yàn)室通訊， 3 ( 1993 ) 385 - 394
No142 ： use of dynamical scattering in the structure determination of cebaite by high resolution electron microscopy , f . h . li and h . hashimoto , acta cryst . , b40 ( 1984 ) 454
用直接法處理高分辨電子顯微像，范海福、鐘子洋、鄭朝德、李方華，電子顯微學(xué)報(bào)， 3 ( 1984 ) no . 4 , 4 。
Saed ( selected area electron diffraction ) , hrem ( high resolution electron microscopy ) and eds ( energy dispersive spectrum ) experiments confirmed that both the porous layer and lamellar layer are composed of nano - crystalline ha ( hydroxyapatite )
實(shí)驗(yàn)中采用了選區(qū)電子衍射、高分辨觀察和x - ray能譜等實(shí)驗(yàn)手段，分析了羥基磷灰石各層的形態(tài)、成分與微結(jié)構(gòu)。
The morphology and structure of ti - dlc films were investigated by high resolution electron microscopy ( hrem ) , atomic force microscopy ( afm ) , scanning electron microscopy ( sem ) and raman spectroscopy . the mechanical properties were investigated by a mts nano indenter xp system with a berkovich indenter . the ti - dlc film with a titanium content of 27at . %
利用高分辨電子顯微鏡( hrem ) 、原子力顯微鏡( afm ) 、掃描電鏡( sem )和拉曼光譜儀等手段分析了沉積ti - dlc薄膜的成分、形貌和結(jié)構(gòu),使用帶berkovich壓頭的納米壓痕儀( mtsnanoindenterxp )測(cè)試了薄膜的力學(xué)性能。
More recent studies show nanowires products with narrow dismeter distribution around 5 - 10mn and lengths ranging from several hundred nanometers to several micrometers can be obtained if the mixture solution of naoh and koh was replaced by koh solution . the nanowires were analyzed by a range of methods including powder x - ray diffraction ( xrd ) , high resolution electron microscopy ( hrem ) , selected area electron diffraction ( saed ) , electron energy loss spectroscopy ( eels ) , xrd and hrem image simulations . the structure of nanowires is determinded to be of the type of k2ti6oi3
利用x射線衍射( xri ) ) 、高分辨電子顯微鏡( hrtem ) 、選區(qū)電子衍射( saed ) 、電子能量損失譜( eels )以及x射線衍射和高分辨像模擬等分析測(cè)試手段，初步分析了這種納米線的生長(zhǎng)機(jī)理，探討了她的結(jié)構(gòu)和光學(xué)性能，實(shí)驗(yàn)結(jié)果顯示這種納米線具有kzti6o ; 3的結(jié)構(gòu)，紫外一可見(jiàn)光吸收光譜顯示， kzti6ol3納米線禁帶寬度約為3 . 45ev 。

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